https://doi.org/10.1051/epjpv/2023010
Regular Article
In situ minority carrier lifetime via fast modulated photoluminescence
1
Institut Photovoltaïque d'Ile-de-France (IPVF), 18 Bvd Thomas Gobert, 91120 Palaiseau, France
2
LPICM, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, route de Saclay, 91128 Palaiseau, France
* e-mail: mateusz.poplawski@ipvf.fr
Received:
31
July
2022
Received in final form:
22
October
2022
Accepted:
30
January
2023
Published online: 17 May 2023
Modulated photoluminescence (MPL) is a powerful technique for determining the effective minority carrier lifetime (τeff) of semiconductor materials and devices. MPL is based on the measurement of phase shifts between two sinusoidal waves (minimal amplitude excitation; and PL signal). In particular, in situ τeff has been proven to be an effective measurement at showing changes within a plasma-enhanced chemical vapor deposition reactor during fabrication of c-Si solar cells. However, the required time for a single measurement, using the previous method, was 40 s. In this paper a new input signal is proposed, called Dolphin's Wave, providing a method for decreasing the required measurement period to under 2 s, using superposition, frequency sweeps, and wavelets.
Key words: In situ lifetime / modulated photoluminescence / silicon / AlOx / Lissajous curves
© M. Poplawski et al., Published by EDP Sciences, 2023
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
